For years,ElectronicManufacturing have been using 2D AOI to detect defects on their product .But due to lacking of 3D information ,2D AOI have some blind-spots, It unable to detect some kind of defects such as chip component tilt , IC tilt, Connector tilt, small part missing or shifting ,IC pin lifting ….etc. Causing either fault skip or false reject frequently , so JET 8000 3D AOI is designed to overcome those problems mention above ,it does all the 3D measurement necessary with highly accuracy thus achieves a more complete optical inspection than a 2D AOI does